Title

Simulation of dc Resistivity Data: Questioning Critical Scaling for the High-Tc Copper Oxides

Authors

Brandon R. Brown, University of San FranciscoFollow

Document Type

Article

Publication Date

2-1-2000

Abstract

We simulate dc V-I data using Gaussian distributions of depinning currents for the mixed state of a copper-oxide superconductor and subsequently submit the data to a critical scaling analysis. Though the simple model for simulation assumes no phase transition for the vortex matter, the generated data exhibit a collapse matching those in the experimental literature. The resulting would-be critical parameters depend on the simulated sensitivity level, reinforcing doubts concerning the utility of the scaling analysis for these systems.

Comments

Article published in Physical Review B, 61, pp 3267-3269 (2000).

© 2000 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevB.61.3267

DOI: 10.1103/PhysRevB.61.3267

Recommended Citation

Brown, Brandon R., "Simulation of dc Resistivity Data: Questioning Critical Scaling for the High-Tc Copper Oxides" (2000). Physics and Astronomy. 27.
https://repository.usfca.edu/phys/27